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Towards 0.1 EV EELS Using a Beam Monochromator And Maxent Deconvolution
Tiemeijer, P.C., Overwijk, M.H.F., de Jong, A.F.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600033341
Date:
August, 2000
File:
PDF, 1.52 MB
2000