FIB/TEM Sample Preparation using a Wafer Dicing Saw

Microscopy and Microanalysis 2000 / 08 Vol. 6; Iss. S2

FIB/TEM Sample Preparation using a Wafer Dicing Saw

Tsung, Lancy, Anciso, Adolfo, Davidson, Bruce, Turner, Robert, Alqaq, Tareq, Skloss, Alois
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600034991
Date:
August, 2000
File:
PDF, 2.99 MB
2000
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