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Assessment of Deformation using the Focused Ion Beam Technique
Burke, M.G., Duda, P.T., Botton, G., Phaneuf, M. W.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600035145
Date:
August, 2000
File:
PDF, 2.30 MB
2000