7-Parameter Automated Measurement of the Shapes of...

Microscopy and Microanalysis 2000 / 08 Vol. 6; Iss. S2

7-Parameter Automated Measurement of the Shapes of Nanoscale Inclusion by TEM

Gabrisch, H., Cong, G., Parvin, B., Kjeldgaard, L., Johnson, E., Dahmen, U.
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600037806
Date:
August, 2000
File:
PDF, 1.82 MB
2000
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