![](/img/cover-not-exists.png)
Diffraction Measurement Of Local Lattice Parameters Using a Nanometer Sized Probe in STEM for Interface Studies
Zuo, J. M.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600033158
Date:
August, 2000
File:
PDF, 2.21 MB
2000