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Towards the Modeling of Impurity-Related Defects in Irradiated n-Type Germanium: a Challenge to Theory
Emtsev, V. V., Oganesyan, G. A.Volume:
54
Journal:
Semiconductors
DOI:
10.1134/S106378262011007X
Date:
November, 2020
File:
PDF, 627 KB
2020