Microstructure and electronic property of pristine and...

Applied Surface Science 2021 / 01 Vol. 536

Microstructure and electronic property of pristine and thermal barrier layers TiN/AlN/ZrB2 buffered 4H-SiC/W interface from first principles study

Zhu, Yunfan, Yang, Haozhen, Zhang, Xiaomin, Yin, Deqiang
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Volume:
536
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.147820
Date:
January, 2021
File:
PDF, 60 KB
2021
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