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Applied Surface Science 2020 / 10

Characterizing interface structure between crystalline and ion bombarded silicon by transmission electron microscopy and molecular dynamics simulations

Rumyantsev, Alexander V., Borgardt, Nikolay I., Prikhodko, Alexander S., Chaplygin, Yuri A.
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Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.148278
Date:
October, 2020
File:
PDF, 2.09 MB
2020
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