Thickness measurement of low-Z films fabricated on thick...

  • Main
  • 2020 / 10
  • Thickness measurement of low-Z films fabricated on thick...
Vacuum 2020 / 10

Thickness measurement of low-Z films fabricated on thick substrate using EDXRF technique

Upmanyu, Arun Kumar, Kailash,, Kapil, Ashutosh, Mehta, D., Kumar, Sanjeev
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2020.109852
Date:
October, 2020
File:
PDF, 3.65 MB
2020
Conversion to is in progress
Conversion to is failed