TEM Observation of Delamination Behavior of c-BN Thin Film

Microscopy and Microanalysis 1997 / 08 Vol. 3; Iss. S2

TEM Observation of Delamination Behavior of c-BN Thin Film

Kim, Ig-Hyeon, Sung, Changmo, Lee, Sang-Ro
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600009302
Date:
August, 1997
File:
PDF, 872 KB
1997
Conversion to is in progress
Conversion to is failed