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An Integrated System for Transmission Electron Microscopy.
Carragher, B., Kisseberth, N., Kriegman, D., Milligan, R.A., Potter, C.S., Pulokas, J., Reilein, A.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600033894
Date:
August, 2000
File:
PDF, 1.96 MB
2000