A TEM Study of Cr Based Contacts to (0001) 6H-SiC

Microscopy and Microanalysis 2000 / 08 Vol. 6; Iss. S2

A TEM Study of Cr Based Contacts to (0001) 6H-SiC

Liu, R.-J., Kim, M. J., Carpenter, R. W., Porter, L. M., Scheunemann, L. P., Davis, R. F.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600037818
Date:
August, 2000
File:
PDF, 1.03 MB
2000
Conversion to is in progress
Conversion to is failed