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Thermal Treatment Induced Dislocation Bundles in Gaas Substrates Studied by Scanning Infrared Polariscopy, Visible-Light Interferometry, Transmission Electron Microscopy, Makyoh and X-Ray Topography
Mock, P.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600038010
Date:
August, 2000
File:
PDF, 1.87 MB
2000