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Roughness Measurements on Thin Magnetic Layers using Energy-Filtering TEM
Grogger, Werner, Cheng, Ning, Krishnan, KannanVolume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600034711
Date:
August, 2000
File:
PDF, 1.60 MB
2000