A Dynamic Reference and Variation-Tolerant Sensing Circuit...

IEEE Transactions on Nanotechnology 2020 Vol. 19

A Dynamic Reference and Variation-Tolerant Sensing Circuit for Deep Nanometer STT-MRAM

Cheng, Guanyi, Pan, Guangchen, Jiang, Yanfeng
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Volume:
19
Year:
2020
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2020.3019511
File:
PDF, 6.09 MB
2020
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