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[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling
Shah, Nimesh, Bose, Sumon Kumar, Chang, Chip Hong, Basu, ArindamYear:
2020
DOI:
10.1109/iscas45731.2020.9180596
File:
PDF, 650 KB
2020