Analysis of Defect-Free Hot Filament CVD-Grown 3C-SiC

Analysis of Defect-Free Hot Filament CVD-Grown 3C-SiC

Van Zeghbroeck, Bart, Brow, Ryan, Borsa, Tomoko, Bobela, David
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Volume:
1004
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.1004.126
Date:
July, 2020
File:
PDF, 1.04 MB
2020
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