![](/img/cover-not-exists.png)
Analysis of Defect-Free Hot Filament CVD-Grown 3C-SiC
Van Zeghbroeck, Bart, Brow, Ryan, Borsa, Tomoko, Bobela, DavidVolume:
1004
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.1004.126
Date:
July, 2020
File:
PDF, 1.04 MB
2020