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TEM Sample Preparation of Polymer Based Nanocomposites using Focused Ion Beam Technique
Miyagawa, H., Chiou, W.-A., Daniel, I.M.Volume:
7
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600030804
Date:
August, 2001
File:
PDF, 1.04 MB
2001