Electrical characterization of 180 nm ATLASPix2 HV-CMOS...

Journal of Instrumentation 2020 / 05 Vol. 15; Iss. 05

Electrical characterization of 180 nm ATLASPix2 HV-CMOS monolithic prototypes for the High-Luminosity LHC

Sultan, D M S, Gonzalez-Sevilla, S., Ferrere, D., Iacobucci, G., Zaffaroni, E., Wong, W., Kiehn, M., Benoit, M.
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Volume:
15
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/15/05/P05022
Date:
May, 2020
File:
PDF, 32.65 MB
2020
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