Optimizing class-constrained wafer-to-order allocation in...

Optimizing class-constrained wafer-to-order allocation in semiconductor back-end production

Deenen, Patrick C., Adan, Jelle, Akcay, Alp
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Volume:
57
Journal:
Journal of Manufacturing Systems
DOI:
10.1016/j.jmsy.2020.07.022
Date:
October, 2020
File:
PDF, 927 KB
2020
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