Advanced Instrumentations for Interface Studies by Electron Energyloss Spectroscopy (EELS, ELNES and ESI)
Rühle, M., Elsässer, C., Scheu, C., Sigle, W.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600033432
Date:
August, 2000
File:
PDF, 1.66 MB
2000