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Site Specific TEM Analysis of Micrometer-Sized Particles with the FIB Lift-Out Technique
Lomness, J. K., Giannuzzi, L. A., Hampto, M. D.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192760003508X
Date:
August, 2000
File:
PDF, 2.76 MB
2000