Strain Field Distribution in Submicron Devices by TEM/CBED....

Microscopy and Microanalysis 2000 / 08 Vol. 6; Iss. S2

Strain Field Distribution in Submicron Devices by TEM/CBED. A European Project

Armigliato, A, Balboni, R, Carnevale, G P, Colpani, P, Frabboni, S, Pavia, G
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600037879
Date:
August, 2000
File:
PDF, 1.51 MB
2000
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