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Sub-Ã ngstrom Transmission Electron Microscopy at 300keV
OâKeefe, M.A., Nelson, E.C., Turner, J.H., Thust, A.Volume:
7
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600030567
Date:
August, 2001
File:
PDF, 1.06 MB
2001