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Identification of cu 6 sn 5 and cu 10 sn 3 Phases in Admixed Dispersal Phase Dental Amalgam by High Resolution Trasmission Electron Microscopy Combined with Convergent Beam Electron Diffraction.
Ramon, Caballero, Amado, Quintero, Oswaldo, HildersVolume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600037284
Date:
August, 2000
File:
PDF, 2.07 MB
2000