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In situ investigation of hot-electron-induced SuzukiâMiyaura reaction by surface-enhanced Raman spectroscopy
Feng, Hui-Shu, Dong, Fan, Su, Hai-Sheng, Sartin, Matthew M., Ren, BinVolume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/5.0023623
Date:
November, 2020
File:
PDF, 2.06 MB
2020