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High-resolution industrial radiography using convolutional neural networks
Ha, Yunu, Ha, Seungwoo, Kim, Jinwoo, Youn, Hanbean, Kim, Ho KyungVolume:
15
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/15/01/C01025
Date:
January, 2020
File:
PDF, 3.05 MB
2020