Hillock defects in InGaAs/InP multi-layers grown by MBE
Hideho Saito, John O. Borland, Hajime Asahi, Haruo Nagai, Kiyoshi NawataVolume:
64
Year:
1983
Language:
english
Pages:
8
DOI:
10.1016/0022-0248(83)90337-8
File:
PDF, 2.07 MB
english, 1983