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Assessment of quality of quartz crystals by EPR and γ-ray diffraction
K. Nienhaus, P. Stegger, G. Lehmann, J.R. SchneiderVolume:
74
Year:
1986
Language:
english
Pages:
8
DOI:
10.1016/0022-0248(86)90130-2
File:
PDF, 644 KB
english, 1986