Comparative Numerical Analysis of the Robustness of Si and...

Materials Science Forum 2020 / 7 Vol. 1004

Comparative Numerical Analysis of the Robustness of Si and SiC PiN Diodes Against Cosmic Radiation-Induced Failure

Huang, Yaren, Lechner, Benedikt, Wachutka, Gerhard
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Volume:
1004
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.1004.1088
Date:
July, 2020
File:
PDF, 1.78 MB
2020
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