TEM Studies on the Microstructure of m-Face Grown 4H-SiC by...

Materials Science Forum 2020 / 7 Vol. 1004

TEM Studies on the Microstructure of m-Face Grown 4H-SiC by Solution Growth

Takahashi, Junro, Kawaguchi, Kotaro, Kusunoki, Kazuhiko, Ueyama, Tomoyuki, Kamei, Kazuhito
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Volume:
1004
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.1004.414
Date:
July, 2020
File:
PDF, 1.19 MB
2020
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