Structural Characterization of a Ga2O3 Epitaxial Layer...

Materials Science Forum 2020 / 7 Vol. 1004

Structural Characterization of a Ga2O3 Epitaxial Layer Grown on a Sapphire Substrate Using Cross-Sectional and Plan-View TEM/STEM Analysis

Hashimoto, Ai, Sako, Hideki, Sameshima, Junichiro, Nakamura, Masayuki, Kobayashi, Takayuki, Motoyama, Shinichi, Otsuka, Yuji
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1004
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.1004.505
Date:
July, 2020
File:
PDF, 5.63 MB
2020
Conversion to is in progress
Conversion to is failed