Comparative Study of Single and Double Gate All Around...

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Comparative Study of Single and Double Gate All Around Cylindrical FET Structures for High-K Dielectric Materials

Kaur, Rajveer, Singh, Balwinder
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Journal:
Transactions on Electrical and Electronic Materials
DOI:
10.1007/s42341-020-00258-0
Date:
November, 2020
File:
PDF, 795 KB
2020
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