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From the Scanning Electron Microscope to the Scanning Electron Macroscope with X-Ray Microanalysis in the ESEM
Gauvin, RaynaldVolume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192760003645X
Date:
August, 2000
File:
PDF, 1.27 MB
2000