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Effects of top electrode material in hafnium-oxide-based memristive systems on highly-doped Si
Saylan, Sueda, Aldosari, Haila M., Humood, Khaled, Abi Jaoude, Maguy, Ravaux, Florent, Mohammad, BakerVolume:
10
Journal:
Scientific Reports
DOI:
10.1038/s41598-020-76333-6
Date:
December, 2020
File:
PDF, 2.59 MB
2020