[IEEE 2020 XXIII International Conference on Soft Computing...

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[IEEE 2020 XXIII International Conference on Soft Computing and Measurements (SCM) - St. Petersburg, Russia (2020.5.27-2020.5.29)] 2020 XXIII International Conference on Soft Computing and Measurements (SCM) - System’s Dependability & Survivability as Local Features of Technical Resilience

Abdoulaeva, Zinaida I., Vinogradov, Valentin V., Topuzov, Marlen E., Makarenko, Dmitry P.
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Year:
2020
DOI:
10.1109/scm50615.2020.9198798
File:
PDF, 101 KB
2020
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