Novel Quadruple-Node-Upset-Tolerant Latch Designs with...

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IEEE Transactions on Emerging Topics in Computing 2020

Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation Environments

Yan, Aibin, Xu, Zhelong, Feng, Xiangfeng, Cui, Jie, Chen, Zhili, Ni, Tianming, Huang, Zhengfeng, Girard, Patrick, Wen, Xiaoqing
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Year:
2020
Journal:
IEEE Transactions on Emerging Topics in Computing
DOI:
10.1109/tetc.2020.3025584
File:
PDF, 1.54 MB
2020
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