Reflection Extended Electron Energy Loss Fine Structure...

Microscopy and Microanalysis 2000 / 08 Vol. 6; Iss. S2

Reflection Extended Electron Energy Loss Fine Structure (REXEELFS) Study Of Damage Induced By Ar + on Hopg (0001) Surface.

Duarte-Moller, A., Espinosa-Magaña, F., Martínez-Sánchez, R.
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600033547
Date:
August, 2000
File:
PDF, 856 KB
2000
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