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A Stress Relief Method to Control Warping of Focused Ion Beam Prepared Membranes for Transmission Electron Microscopy
Rossie, B.B., Stevie, F.A., Shofner, T.L., Brown, S.R., Irwin, R.B.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600035157
Date:
August, 2000
File:
PDF, 1.62 MB
2000