Image Reconstruction From TEM Diffraction Patterns Using...

Microscopy and Microanalysis 2000 / 08 Vol. 6; Iss. S2

Image Reconstruction From TEM Diffraction Patterns Using Feinup Algorithm

Chen, Q., Weierstall, U., Spence, J. C. H.
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600032669
Date:
August, 2000
File:
PDF, 2.01 MB
2000
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