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Introducing and studying origin of deep electron traps in Ba1-xZrSi3O9:xEu for optical data storage
Zhou, Zhenzhen, Wang, Caiyan, Deng, Mingxue, Xu, Xiaoke, Liu, QianJournal:
Optical Materials
DOI:
10.1016/j.optmat.2020.110617
Date:
November, 2020
File:
PDF, 242 KB
2020