Scanning Electron Microscopy With Polarization Analysis...

Microscopy and Microanalysis 1999 / 08 Vol. 5; Iss. S2

Scanning Electron Microscopy With Polarization Analysis (Sempa) Investigations Of Multilayer Magnetism

J. Unguris,, Celotta, R. J., Pierce, D. T.
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Volume:
5
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600013520
Date:
August, 1999
File:
PDF, 867 KB
1999
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