Atomic Scale Grain Boundary Analysis by Incoherent Imaging...

Microscopy and Microanalysis 2000 / 08 Vol. 6; Iss. S2

Atomic Scale Grain Boundary Analysis by Incoherent Imaging With TEM/STEM

Kawasaki, M., Yamazaki, T., Watanabe, K., Shiojiri, M.
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600033110
Date:
August, 2000
File:
PDF, 1.98 MB
2000
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