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Grain Boundary Characterization in Yttria-Stabilized Zirconia by TEM Spectrum Lines
Evans, N. D., Imamura, P. H., Mecartneyf, M. L.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600033596
Date:
August, 2000
File:
PDF, 2.05 MB
2000