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Coupling Automated Electron Backscatter Diffraction with Transmission Electron and Atomic Force Microscopies
Schwartz, A.J., Kumar, M., Bedrossian, P.J., King, W.E.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600037193
Date:
August, 2000
File:
PDF, 2.20 MB
2000