An instrument for precision controlled radiation exposures, charged beam profile measurement, and real-time fluence monitoring beyond 10 16n eq /cm 2
Hoeferkamp, M.R., Wickramasinghe, J.S.T., Grummer, A., Rajen, I., Seidel, S.Volume:
15
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/15/05/P05024
Date:
May, 2020
File:
PDF, 11.05 MB
2020