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Complexion dictated thermal resistance with interface density in reactive metal multilayers
Saltonstall, Christopher B., McClure, Zachary D., Abere, Michael J., Guzman, David, Reeve, Samuel Temple, Strachan, Alejandro, Kotula, Paul G., Adams, David P., Beechem, Thomas E.Volume:
101
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.101.245422
Date:
June, 2020
File:
PDF, 1.22 MB
2020