[IEEE 2020 8th International Conference on Reliability,...

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[IEEE 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2020.6.4-2020.6.5)] 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Fake News Detection with Integration of Embedded Text Cues and Image Features

Mangal, Deepak, Sharma, Dilip Kumar
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Year:
2020
DOI:
10.1109/ICRITO48877.2020.9197817
File:
PDF, 704 KB
2020
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