[American Society of Agricultural and Biological Engineers 2005 Tampa, FL July 17-20, 2005 - ()] 2005 Tampa, FL July 17-20, 2005 - Non-Destructive Measurement of Moisture Pattern Using MRI in A Wheat Kernel during Drying
Prabal K. Ghosh,, Digvir S. Jayas,, Marco L.H. Gruwel,, Noel D.G. White,Year:
2005
DOI:
10.13031/2013.19102
File:
PDF, 1.27 MB
2005