Ir and raman study of Si1−xCx:H amorphous thin films

Journal of Molecular Structure 1992 Vol. 267; Iss. none

Ir and raman study of Si1−xCx:H amorphous thin films

S. Lugomer, M. Ivanda, D. Gracin, K. Furić, A. Maksimović
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Volume:
267
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0022-2860(92)87054-y
File:
PDF, 310 KB
english, 1992
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